Milan, March 5th 2020 – First heavy ions testing campaign for RAD-PROM test chips at LNS (Laboratori Nazionali del Sud) in Catania (Sicily) where RC28FTC01I (IHP 130nm silicon) and RC28FTC01X (X-FAB 180nm silicon) have been investigated using Xenon ions with a LET of 60 MeV*cm2/mg (Si).
No SELs have been observed neither for Dog-Bone AntiFuse memory cells nor ELT (Edge-less) cells.

… and of course the celebration of the results with our friend Lelio and a good glass of Rum and Vodka…